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#69268
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Material Type
Electronic Resource
Title
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits [electronic resource] : The system on chip approach / Y. Sun [Ed].
Added Author
Yichuang Sun,, ed.
Subject
Application-specific integrated circuits.
Integrated circuits--Testing.
Linear integrated circuits.
Systems on a chip.
Testing.
analogue integrated circuits.
automatic testing.
integrated circuit testing.
mixed analogue-digital integrated circuits.
system-on-chip.
ISBN
9780863419997
Published/Created
Stevenage : IET, 2008.
Links
http://dx.doi.org/10.1049/PBCS019E
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เงื่อนไข
1. ส่งคำขอเวลา 8.30-11.00น รับหนังสือเวลา 16.00น.
2. ส่งคำขอหลังเวลา 11.00น. รับหนังสือในวันทำการถัดไป
3. ส่งคำขอ วันศุกร์ช่วงบ่าย หรือ วันเสาร์-อาทิตย์ รับหนังสือวันจันทร์ 16.00น.
4. ติดต่อรับหนังสือด่วนได้ที่ เคาน์เตอร์บริการยืม-คืน ชั้น 3 *ภายใน 3 วัน*
ติดต่อสอบถามข้อมูลเพิ่มเติม โทร. 2352
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Citation
APA
Yichuang Sun. (2008).
aTest and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuitsh[electronic resource] :bThe system on chip approach /cY. Sun [Ed].
Stevenage :IET
MLA
Yichuang Sun.
aTest and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuitsh[electronic resource] :bThe system on chip approach /cY. Sun [Ed].
Stevenage :IET, 2008.
Chicago
Yichuang Sun. 2008.
aTest and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuitsh[electronic resource] :bThe system on chip approach /cY. Sun [Ed].
Stevenage :IET.
Vancouver
Yichuang Sun. aTest and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuitsh[electronic resource] :bThe system on chip approach /cY. Sun [Ed]. Stevenage :IET; 2008.
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